| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 7999949 | Journal of Alloys and Compounds | 2015 | 4 Pages |
Abstract
(a) The Hall resistivity Ïxy(H) measured at different temperatures and the M(H) hysteresis loops at 5Â K for the Mn0.48Si0.52 film with a thickness of 20Â nm. (b) The relationship between Ïxy and M obtained by using the data in Figs. 4(a) and 2(a). (c) The relationship between the anomalous Hall coefficient Rs and the longitudinal resistivity Ïxx.79
Related Topics
Physical Sciences and Engineering
Materials Science
Metals and Alloys
Authors
Ai-chun Yang, Kun Zhang, Shi-shen Yan, Shi-shou Kang, Yu-feng Qin, Juan Pei, Li-min He, Huan-huan Li, You-yong Dai, Shu-qin Xiao, Yu-feng Tian,