Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
8001519 | Journal of Alloys and Compounds | 2014 | 24 Pages |
Abstract
Optical properties of Yb-doped GaN single crystalline nanorods (NRs) grown by molecular beam epitaxy (MBE) under different growth conditions on silicon (1Â 1Â 1) substrates were investigated. High resolution scanning electron microscopy (HRSEM) was used to study the shape and size of GaN:Yb3+ NRs which are found to be about 25Â nm diameter and 300-500Â nm long. The low temperature cathodoluminescence spectra (CL) of GaN:Yb3+ NRs were examined. The GaN:Yb3+ NRs CL spectra show visible broad emission due to GaN host defects and near infrared emission associated with Yb3+ ions. Comparative investigations of the luminescent properties of GaN:Yb3+ NRs with those of GaN:Yb3+ thin films show the presence of some similarities between the lattice locations of Yb3+ ions in these hosts with a broadening of the emission lines which can be explained by the defect surface effect. Assuming the presence of two sites occupied by Yb3+ ions, the majority of CL emission lines was attributed. The experimental Stark energy levels of the two Yb3+ ion manifolds are established for the Yb-doped GaN NRs.
Related Topics
Physical Sciences and Engineering
Materials Science
Metals and Alloys
Authors
T. Kallel, M. Dammak, J. Wang, W.M. Jadwisienczak, J. Wu, R. Palai,