Article ID Journal Published Year Pages File Type
8001926 Journal of Alloys and Compounds 2014 6 Pages PDF
Abstract
It was seen that the ZnO buffer layer had a great influence on the orientation and defect density of GZO thin films from X-ray Diffraction (XRD) peaks and High Resolution Transmission Electron Microscopy (HRTEM) images.
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Related Topics
Physical Sciences and Engineering Materials Science Metals and Alloys
Preview
Effect of a ZnO buffer layer on the properties of epitaxial ZnO:Ga films deposited on c-sapphire substrate
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