Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
8012554 | Materials Letters | 2018 | 13 Pages |
Abstract
The (TiZrNbHfTa)N/WN multicomponent coatings were deposited by vacuum arc evaporation under different substrate bias (â90 and â280â¯V). X-ray photoelectron spectroscopy was used for analyzing of complex composition of investigated coatings by reflecting of atomic scale chemical interactions. The structural investigations showed the formation of a simple disordered solid solution in (TiZrNbHfTa)N layer, β-W2N phase in WN layer with fcc crystal structure and highly disordered bcc (1â¯1â¯0) and (2â¯2â¯0)-oriented high-entropy alloy phases, regardless of the applied bias potential. It was shown that with increasing of substrate bias from â90 to â280â¯V, there is a slight decrease of hardness from 34 to 31â¯GPa and increase of Young's modulus from 325 to 337â¯GPa, which can be explained by annihilation of point defects and precipitation of relatively softer metallic phase.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
A.A. Bagdasaryan, A.V. Pshyk, L.E. Coy, M. KempiÅski, A.D. Pogrebnjak, V.M. Beresnev, S. Jurga,