Article ID Journal Published Year Pages File Type
8013046 Materials Letters 2018 9 Pages PDF
Abstract
SiO2:TiO2 films were prepared on silicon wafers by sol-gel technique. Evolution of their optical parameters was studied with spectroscopic ellipsometry in function of temperature. It was evidenced the effect of absorbed/desorbed water on the measured value of refractive index.
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Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
Preview
Effect of temperature changes on parameters of the sol-gel derived silica-titania films
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