Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
8013229 | Materials Letters | 2018 | 11 Pages |
Abstract
Cadmium Sulphide (CdS) thin films were deposited on to well-cleaned soda lime glass substrates using hot wall deposition technique at room temperature. The structure of CdS thin films was found to be hexagonal withâ¯ã0â¯0â¯2ã orientation and after annealing the film crystallized toâ¯ã0â¯0â¯2ã, ã1â¯0â¯1ã, ã1â¯0â¯2ã, ã1â¯1â¯2ãâ¯directions. Raman Spectroscopy confirmed the hexagonal structure with a shift at 312â¯cmâ1. SAED pattern from the Transmission electron microscopy also confirmed the formation of hexagonal CdS. X-ray Photoelectron Spectroscopy confirmed the formation of CdS with relevant at% of Cd and S. Field emission scanning electron microscopy images revealed smooth surface of the thin film with distinctive grains. Atomic force microscopy results showed a surface roughness of 4.47â¯nm. Transmission spectra of the films were studied and the transparency was found to be above 80%. The optical band gap was found to be around 2.4â¯eV in accordance with the reported values. The results show that device quality buffer layers can be deposited using Hot-wall deposition.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
G. Balaji, R. Balasundaraprabhu, S. Prasanna, N. Prabavathy, M.R. Venkatraman, Vijayshankar Asokan, N. Muthukumarasamy, M.D. Kannan, K. Sivakumaran,