| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8013692 | Materials Letters | 2018 | 9 Pages |
Abstract
This study experimentally investigates the fractal nature of DC magnetron sputtered indium-tin oxide (ITO) fabricated utilizing mixed ambient combinations and post-annealed at 450â¯Â°C in air towards solar cell applications. The structural properties of the films were examined by X-ray diffraction technique. In addition, three-dimensional (3-D) surface morphology of the films was analyzed using the areal autocorrelation function and pseudo-topothesy K for the atomic force microscopy images. The fractal nature of films was co-related with respect to electrical and optical properties of ITO films prepared under five different ambient conditions.
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Authors
Åtefan Å¢Älu, Slawomir Kulesza, Miroslaw Bramowicz, Adam M. Pringle, Joshua M. Pearce, Marikkan Murugesan, Vishnukanthan Venkatachalapathy, J. Mayandi,