| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8016292 | Materials Letters | 2016 | 5 Pages |
Abstract
The morphology and magnetic performance of CoPd multilayer nanodots have been investigated by a combination of DC sputtering, anodic aluminum oxide(AAO) template method and Ar ion etching. The nanodots exhibit a normal switching field distribution(SFD) of 17%, which is comparative to Bit-patterned media (BPM) made by e-Beam. It is found that the first-order reverse curve (FORC) data of CoPd nanodots have a good match with the mean-field model, which shows dipolar interaction contributes as small as 8.4% to the total SFD. Magnetic force microscope(MFM) imaging at a certain location confirms the FORC results by observing the effect of dipolar interaction directly. Our CoPd multilayer nanodots can be a good candidate for BPM application.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
X.T. Zhao, W. Liu, Z.M. Dai, D. Li, X.G. Zhao, Z.H. Wang, D. Kim, C.J. Choi, Z.D. Zhang,