Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
8017719 | Materials Letters | 2015 | 4 Pages |
Abstract
Anatase TiO2 (a-TiO2) thin films were successfully deposited on the Y-stabilized ZrO2 (YSZ)(100) substrates at different substrate temperatures (Ts) (500-650 °C) by metal organic chemical vapor deposition (MOCVD). The film deposited at 600 °C showed the best crystalline quality with a single growth orientation, for which the X-ray diffraction (XRD) and high resolution transmission electron microscopy (HRTEM) measurements identified an epitaxial relationship of a-TiO2(001)||YSZ(100) and a-TiO2[110]||YSZ[001]. A schematic diagram was proposed to explain the epitaxial growth mechanism between the substrate and the film. The average transmittance of the film deposited at 600 °C exceeded 93% in the visible range and its optical band gap was estimated to be 3.16 eV.
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Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Weiguang Wang, Jin Ma, Mingxian Wang, Zhao Li, Xuejian Du, Xianjin Feng, Wei Zhao, Haisheng Xu, Caina Luan,