| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8021217 | Materials Letters | 2014 | 4 Pages |
Abstract
Novel deformation structures of commercial pure (CP) Ti induced by equal channel angular pressing (ECAP) at room temperature have been studied by electron backscattering diffraction (EBSD). All the deformation twins occurring in CP Ti, {101¯1}, {112¯1}, {101¯2} and {112¯2} have been revealed surprisingly in one original grain as first, secondary or third generation twins. 3 variants of {101¯2} twins have been identified. The deformation mechanism of CP-Ti during ECAP at room temperature in comparison to the ECAP at elevated temperatures is discussed.
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Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Y.J. Chen, Y.J. Li, X.J. Xu, J. Hjelen, H.J. Roven,