Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
8023921 | Surface and Coatings Technology | 2018 | 6 Pages |
Abstract
Ti2AlN is a prominent ternary nitride and belongs to the class of nanolaminated Mn + 1AXn phase materials which combine metallic and ceramic properties. In this work we report on the successful synthesis of polycrystalline Ti2AlN thin films with a preferential (000l) orientation on a polycrystalline Al2O3 substrate by depositing multiple Ti-AlN double layers and applying a subsequent annealing step. Investigations with scanning electron microscopy (SEM), X-ray diffraction (XRD), electron back scatter diffraction (EBSD) and Raman spectroscopy reveal a successful transformation of the multilayer system into a polycrystalline and dense Ti2AlN coating with a thickness of 2.7 μm. The observed grains are plate-like shaped with an in-plane size of about 100 to 300 nm and a thickness of 30 to 60 nm. Furthermore EBSD measurements proof that these macroscopic grains have a preferred orientation in the [000l] direction. We believe that a (000l)-textured microstructure will lead to new applications for protective coatings on polycrystalline substrates.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Lukas Gröner, Lutz Kirste, Sabine Oeser, Alexander Fromm, Marco Wirth, Frank Meyer, Frank Burmeister, Chris Eberl,