| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 80260 | Solar Energy Materials and Solar Cells | 2010 | 7 Pages |
Abstract
All relevant physical properties of semiconductors show spatial fluctuations. It is possible to analyze this spatial variation statistically using variogam analysis. The present paper gives a first example for the application of this method, for the case of charge-carrier effective lifetime, which was measured with the microwave-detected photoconductivity (MDP) system.It can be shown that different types of spatial distribution of defects in wafers are well-characterized by different variograms. Furthermore, there exist different spatial correlation ranges and variances of charge-carrier effective lifetime in wafers from different height positions in a brick.
Related Topics
Physical Sciences and Engineering
Chemical Engineering
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Authors
Kathrin Niemietz, Anett Wagner, B. Gründig-Wendrock, Dietrich Stoyan, Jürgen R. Niklas,