| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8029774 | Surface and Coatings Technology | 2013 | 11 Pages |
Abstract
In all cases, special emphasis has been placed upon the importance of suitable precursors, deposition parameters and interfacial characterization. In addition, dielectric properties have been correlated to structural and compositional characteristics by scanning probe microscopy with conductive tips, which has been used to image defects inside the grains or heterogeneities at the grain boundaries.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Raffaella Lo Nigro, Patrick Fiorenza, Maria R. Catalano, Gabriele Fisichella, Fabrizio Roccaforte, Graziella Malandrino,