| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8030384 | Surface and Coatings Technology | 2013 | 6 Pages |
Abstract
⺠Simple method for focused ion beam milling based residual stress measurement ⺠New H-bar geometry for simple milling technique and digital image correlation ⺠Demonstration on two amorphous carbon coating systems ⺠Finite element analysis of H-bar for stress analysis
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
M. Krottenthaler, C. Schmid, J. Schaufler, K. Durst, M. Göken,