| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8032293 | Surface and Coatings Technology | 2011 | 5 Pages |
Abstract
âºAnnealing-induced amorphization of sputtered Cu51Zr42Al4Ti3 film is clarified. âºThe result is confirmed with in-situ TEM in conjunction with ex-situ AFM and XRD. âºHeated to 438 °C, the film becomes fully amorphous. âºThe annealing-induced amorphization appear to be rather general.
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Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Jinn P. Chu, Chiu-Yen Wang, L.J. Chen, Qi Chen,