Effects of annealing temperature and Eu concentration on the structural and photoluminescence properties of Eu-doped SnO2 thin films prepared by a metal organic decomposition method

In this study, Eu-doped SnO2 thin films were prepared by a metal organic decomposition method through a pyrolysis of organic acid salts. The effects of annealing temperature and Eu concentration on the structural and photoluminescence properties of the films were investigated. X-ray diffraction measurements showed that the crystal structure corresponded to tetragonal rutile SnO2 regardless of the annealing temperature or Eu concentration. Additionally, X-ray diffraction, Fourier transform infrared spectroscopy and atomic force microscopy measurements indicated an improvement in crystalline quality with increasing annealing temperature. Photoluminescence spectra exhibited Eu-related emissions around 588-599 nm and 620 nm. It was found that the photoluminescence properties were strongly dependent on both the annealing temperature and Eu concentration. The highest photoluminescence intensity around 588-599 nm was obtained for an Eu concentration of 7.2 at.% for samples annealed at 1000 °C.