Article ID Journal Published Year Pages File Type
8032882 Thin Solid Films 2018 30 Pages PDF
Abstract
Titanium oxide layers were prepared by sputter deposition with plasma emission monitoring in the whole stoichiometry range between Ti and TiO2 without and with substrate heating to 240 °C. The layers were characterized with regard to their crystal structure and specific resistance. Optical constants were determined in the spectral range between 240 nm and 38 μm. The thermochromic behavior of a prepared Ti2O3 layer was measured and compared to calculations for bulk material.
Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
Authors
, ,