| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8033220 | Thin Solid Films | 2018 | 4 Pages |
Abstract
The buckling structures of rigid films on soft substrates exhibit a “mexican hat” shape characterized by a nanometer scale depression at both edges. Based on finite elements simulations, a mathematical formulation is proposed to extract the elastic modulus mismatch between the film and its substrate, from the fine characterization of the buckle morphology.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
R. Boijoux, G. Parry, C. Coupeau,