| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8033476 | Thin Solid Films | 2016 | 33 Pages |
Abstract
The morphology of prepared films was studied by Scanning Electron Microscopy and Atomic Force Microscopy. Chemical compositions in the whole layer and on the surface of films were investigated using Fourier transform infrared and X-ray photoelectron spectroscopy, respectively.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Alaa Fahmy, Jörg Friedrich, Fabienne Poncin-Epaillard, Dominique Debarnot,