| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8034801 | Thin Solid Films | 2015 | 5 Pages |
Abstract
This work contributes to the discussion on the influence of the back electrode on the capacitance spectroscopy results of Cu(In,Ga)Se2-based solar cells. Devices with Mo and Pt back electrodes were investigated by means of admittance spectroscopy and carrier concentration profiling. We present arguments supporting the statement that admittance spectroscopy signals, which are commonly observed and reported, cannot be exclusively attributed to the non-ohmic character of the back electrode.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
A. Urbaniak, M. Igalson, N. Barreau, M. Tomassini,