Orientation control and electrical properties of YBa2Cu3O7 − δ deposited onto CeO2 buffer films by laser chemical vapor deposition using liquid source precursors

CeO2 and YBa2Cu3O7 − δ (YBCO) films were deposited onto multilayer-coated Hastelloy C276 tape by laser chemical vapor deposition using liquid source precursors. The effect of the thickness of the CeO2 buffer film grown at 720 K on the orientation and electrical properties of the YBCO has been investigated. The optimal thickness of the CeO2 layer was found to be 97 nm resulting in the highest critical temperature of 90 K and a critical current density of 0.6 MA cm− 2. The deposition rate of the YBCO films was approximately 7 μm h− 1.