Article ID Journal Published Year Pages File Type
8035109 Thin Solid Films 2014 4 Pages PDF
Abstract
Using thermal co-evaporation we have prepared epitaxial Cu2ZnSnS4 (CZTS) films on Si(001) substrates. A substrate temperature as high as 370 °C and proper substrate cleaning (HF-dip followed by thermal desorption of surface hydrogens) are found to be necessary for the epitaxial growth. Detailed transmission electron microscopy measurements and X-ray diffraction studies are used to reveal the orientation relation of the CZTS films with the underlying silicon substrate, and the formation of defects within the CZTS layer.
Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
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