Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
8035217 | Thin Solid Films | 2014 | 5 Pages |
Abstract
Hole mobilities at low and room temperature (RT) have been studied for a strained sGe/SiGe heterostructure using standard Van der Pauw resistivity and Hall effect measurements. The range of magnetic field and temperatures used were â 14 T < B < + 14 T and 1.5 K < T < 300 K respectively. Using maximum entropy-mobility spectrum analysis (ME-MSA) and Bryan's algorithm mobility spectrum (BAMS) analysis, a RT two dimensional hole gas drift mobility of (3.9 ± 0.4) Ã 103 cm2/V s was determined for a sheet density (ps) 9.8 Ã 1010 cmâ 2 (by ME-MSA) and (3.9 ± 0.2) Ã 103 cm2/V s for a sheet density (ps) 5.9 Ã 1010 cmâ 2 (by BAMS).
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
O.A. Mironov, A.H.A. Hassan, R.J.H. Morris, A. Dobbie, M. Uhlarz, D. Chrastina, J.P. Hague, S. Kiatgamolchai, R. Beanland, S. Gabani, I.B. Berkutov, M. Helm, O. Drachenko, M. Myronov, D.R. Leadley,