| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8035683 | Thin Solid Films | 2014 | 11 Pages |
Abstract
Depth profiling showed that the increase of the potential barrier is caused by the diffusion of H2O/OHâ through the grain boundaries leading to the formation of Zn(OH)2 or similar species or adsorption of species. They also indicate the presence of chloride and sulfide in the top layer and the possible presence of Zn5(OH)8Cl2·H2O and Zn4SO4(OH)6·nH2O
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Mirjam Theelen, Twan Boumans, Felix Stegeman, Fallon Colberts, Andrea Illiberi, Jurgen van Berkum, Nicolas Barreau, Zeger Vroon, Miro Zeman,