Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
8035783 | Thin Solid Films | 2013 | 5 Pages |
Abstract
By determining the parameters of the parametric model (PM) for selected Al compositions x of In1 â xAlxSb, we provide the information needed to accurately calculate the room-temperature dielectric functions ε = ε1 + iε2 of these alloys from 1.5 to 6.0 eV as a continuous function of x over the entire composition range 0 â¤Â x â¤Â 1. Our parameters are determined from data obtained by spectroscopic ellipsometry for Al compositions x = 0.00, 0.142, 0.341, 0.539, 0.754, and 1.00. The PM dielectric functions are found to be in excellent agreement with the data. These results will be useful in many aspects of research and technology.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Mangesh S. Diware, Tae Jung Kim, Jae Jin Yoon, Nilesh S. Barange, Jun Seok Byun, Han Gyeol Park, Young Dong Kim, Sang Hoon Shin, Jin Dong Song,