| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8036030 | Thin Solid Films | 2013 | 6 Pages |
Abstract
Magnetic force microscope (MFM) tips are prepared by coating Si tips of 4 nm radius with FePd, FePt, and CoPt films of 80 nm thickness at room temperature followed by annealing at 600 °C. The spatial resolution and the switching field are investigated. The resolution of about 9 nm is realized for all the tips. On the contrary, the switching fields of FePd-, FePt-, and CoPt-coated tips are 117.4, 37.8, and 268.6 kA/m, respectively. The crystal structure and the magnetic properties of coated magnetic thin films prepared on flat Si substrates are measured and the interrelationships with the MFM tip characteristics are briefly investigated.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Shinji Ishihara, Mitsuru Ohtake, Masaaki Futamoto,