Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
8036467 | Thin Solid Films | 2013 | 5 Pages |
Abstract
Polycrystalline BiFeO3 thin films with overdosed Bi of up to 15 mol% were prepared through chemical solution deposition. All the films crystallized in R3c structure after annealing at 550 °C for 5 h by normal furnace. The analysis of out-of-plane and in-plane X-ray diffraction showed that the lattice constants and in-plane stress of films strongly depended on the amount of excess Bi, where lattice constants were minimums and in-plane stress was a maximum at excess Bi of 5 mol%. The films exhibited the largest saturation polarization of 14.8 μC cmâ 2 at excess Bi of 5 mol%, revealing a correlation with the in-plane tensile stress. These results suggested that the excess Bi greatly influenced the polarization properties of BiFeO3 thin films through the lattice distortion induced by the in-plane stress.
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Authors
Jingdan Yan, Manabu Gomi, Takashi Hattori, Takeshi Yokota, Huaihe Song,