Surfactant influence on interface roughness and magnetoresistance value in Fe/Cr multilayers

Effect of interfacial roughness on magnetoresistance (MR) value in Fe/Cr multilayers was studied. The Fe/Cr multilayers were prepared on a MgO(100) substrate by molecular beam deposition technique and doped with Bi and In surfactants. The morphology of the layers, especially the interface structure, was studied using conversion electron Mössbauer spectroscopy (CEMS). CEMS spectra indicate an increase in the width of interfaces of modified samples; this effect is stronger for the sample doped with In. Auger electron spectroscopy shows the segregation of the surfactant to the surface. Magnetic and magnetotransport properties of the samples were studied by the magneto-optic Kerr effect and MR measurements. The observed hysteresis loops confirm in all samples antiferromagnetic arrangement of Fe layers sandwiched between Cr while the value of MR is larger for the doped samples. It was observed that roughening of the interfaces resulted in an increase of the MR effect.