The effect of 200Â MeV Ag ions on the transport property of yttrium barium copper oxide/silver composite thin film

YBa2Cu3O7 − x/Ag (3 at. %) composite thin films are grown by pulsed laser deposition. The films are irradiated with 200 MeV silver ions at room temperature. X-ray diffraction and Raman techniques are used for microstructural disorder analysis. The fall in the intensity of the peaks after irradiation gives a clue of amorphization occurring in the sample. Raman spectra show the loss of apical oxygen O (4) at 500 cm− 1 and a defect peak appearing at 600 cm− 1 on irradiation. Magnetization vs. field loop is recorded at 40 K. The synergistic impact of Ag and columnar defects generated by irradiation, deteriorate material property and impedes the flow of supercurrent thereby resulting in decrease of critical current density and flux pinning.