| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8037136 | Thin Solid Films | 2013 | 6 Pages |
Abstract
⺠Thin sol-gel coatings are characterized by a multilayer model. ⺠Refractive index increases, thickness decreases with heat treatment temperature. ⺠Ellipsometry enables characterization of complete multilayer model. ⺠Findings confirmed by refractometry, reflectometry and calotte grinding.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Vincent L.Y. Loke, Norbert Riefler, Andreas Mehner, Torsten Prenzel, Timo Hoja, Thomas Wriedt, Lutz Mädler,