Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
8037143 | Thin Solid Films | 2013 | 7 Pages |
Abstract
⺠An analytical solution for the migration of inclusion in piezoelectric film ⺠Characteristics of the inclusion motion in piezoelectric film are visualized. ⺠Electric field affects inclusion migration at the position where stress is zero.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Y. Qin, X. Wang,