| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8037206 | Thin Solid Films | 2013 | 6 Pages |
Abstract
⺠The ablation width and depth generally depend on the laser fluence. ⺠The scanning speed and the repetition frequency must match each other. ⺠Slight ablation of the glass substrate can completely remove F-doped tin oxide.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Huan Yang, Dongchuan Fu, Ming Jiang, Jun Duan, Fei Zhang, Xiaoyan Zeng, Udo Bach,