| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8037329 | Thin Solid Films | 2013 | 8 Pages |
Abstract
⺠The ZnO crystal orientation was influenced by strain/stress of the film. ⺠Highly c-axis oriented ZnO were grown at minimum strain/stress. ⺠Minimum stress/strain of ZnO film leads to lower defects. ⺠Bandgap and defects were closely intertwined with strain/stress. ⺠We report additional electrical and optical properties based on sol concentration.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Mohd Firdaus Malek, Mohamad Hafiz Mamat, Mohd Zainizan Sahdan, Musa Mohamed Zahidi, Zuraida Khusaimi, Mohamad Rusop Mahmood,