| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8037399 | Thin Solid Films | 2013 | 6 Pages |
Abstract
⺠X-ray diffraction was used to study the structure of SnS films. ⺠Transmission electron microscope confirms the crystalline state of SnS films. ⺠The refractive index increases notably with increasing the film thickness. ⺠The optical band gap of SnS films decreases with increasing film thickness.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
M.S. Selim, M.E. Gouda, M.G. El-Shaarawy, A.M. Salem, W.A. Abd El-Ghany,