| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8037448 | Thin Solid Films | 2013 | 5 Pages |
Abstract
⺠We have investigated mechanical properties of nanometer-thick multilayer vermiculite. ⺠Suspended vermiculite membranes were characterized by atomic force microscopy. ⺠Mechanical deformation of the membranes was analyzed with finite element analysis. ⺠In-plane elastic modulus of the exfoliated multilayer vermiculite was 175 ± 16 GPa.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Ji Won Suk, Richard D. Piner, Jinho An, Rodney S. Ruoff,