Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
8037640 | Ultramicroscopy | 2018 | 8 Pages |
Abstract
In this paper we report on an alternative to a pixelated detector, which is able to directly deliver the COM of a diffraction disk's intensity distribution with frequencies up to 200Â kHz. We present measurements on the sensitivity of this detector as well as first results from DPC imaging. From these results we expect the detector also to serve well in sub-atomic DPC field sensing, possibly replacing today's segmented or pixelated detectors.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Felix Schwarzhuber, Peter Melzl, Simon Pöllath, Josef Zweck,