Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
8037671 | Ultramicroscopy | 2018 | 24 Pages |
Abstract
In atom probe tomography (APT), multiple events can arise as a consequence of e.g. correlated field evaporation and molecular ion dissociation. They represent challenging cases for single-particle detectors and can cause compositional as well as spatial inaccuracies. Here, two state-of-the-art atom probe microscopes (Cameca LEAP 5000 XS and 5000 XR) were used to investigate cemented tungsten carbide, which exhibits high amounts of multiple events. By advanced data analysis methods, the natural character of the multiple events, as well as the performance of the APT detectors, are assessed. Accordingly, possible signal loss mechanisms are discussed.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Zirong Peng, Francois Vurpillot, Pyuck-Pa Choi, Yujiao Li, Dierk Raabe, Baptiste Gault,