Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
8037727 | Ultramicroscopy | 2018 | 5 Pages |
Abstract
We have developed and characterized a plasmon-excitation scattering-type near-field scanning optical microscope with sharpened single carbon nanotube probe. The developed microscope can optically capture differences in the refractive index of single-nanometer surface structures. Statistical analysis enabled us to estimate the precision of the optical length measurement to 1.8â¯nm.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Takehiro Tachizaki, Toshihiko Nakata, Kaifeng Zhang, Ichiro Yamakawa, Shin-ichi Taniguchi,