| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8037738 | Ultramicroscopy | 2018 | 4 Pages |
Abstract
Aberration correctors offer greatly enhanced resolution in electron microscopes, however can require dramatically more complicated adjustments. A method of computer adjustment of a probe forming aberration corrector in a Scanning Transmission Electron Microscope (STEM) is proposed and analyzed using image simulation. This method works directly with the image and should work well with crystalline specimens. It does not have a significant dependence on post specimen lens aberrations.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Earl J. Kirkland,