| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8037778 | Ultramicroscopy | 2018 | 9 Pages |
Abstract
In this paper, we propose an algorithm for automatically correcting the nonlinear effects and the subsequent cupping artifacts. It is applicable to samples in which chemical compositions can be segmented based on image gray levels. The correction is realized by iteratively estimating the nonlinear relationship between projection intensity and sample thickness, based on which the projections are linearized. The correction and reconstruction algorithms are tested on simulated and experimental data.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Zhichao Zhong, Richard Aveyard, Bernd Rieger, Sara Bals, Willem Jan Palenstijn, K. Joost Batenburg,