Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
8037840 | Ultramicroscopy | 2016 | 5 Pages |
Abstract
We propose an extension of ptychography where the target sample is scanned separately through several probes with distinct amplitude and phase profiles and a diffraction image is recorded for each probe and each sample translation. The resulting probe-diverse dataset is used to iteratively retrieve high-resolution images of the sample and all probes simultaneously. The method is shown to yield significant improvement in the reconstructed sample image compared to the image obtained using the standard single-probe ptychographic phase-retrieval scheme.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
I. Peterson, R. Harder, I.K. Robinson,