Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
8037906 | Ultramicroscopy | 2016 | 14 Pages |
Abstract
Electron backscatter diffraction (EBSD) dislocation microscopy is an important, emerging field in metals characterization. Currently, calculation of geometrically necessary dislocation (GND) density is problematic because it has been shown to depend on the step size of the EBSD scan used to investigate the sample. This paper models the change in calculated GND density as a function of step size statistically. The model provides selection criteria for EBSD step size as well as an estimate of the total dislocation content. Evaluation of a heterogeneously deformed tantalum specimen is used to asses the method.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
T.J. Ruggles, T.M. Rampton, A. Khosravani, D.T. Fullwood,