Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
8037907 | Ultramicroscopy | 2016 | 19 Pages |
Abstract
It is very challenging to measure the chemical composition of hetero nanostructures in a reliable and quantitative manner. Here, we propose a novel and straightforward approach that can be used to quantify energy dispersive X-ray spectra acquired in a transmission electron microscope. Our method is based on a combination of electron tomography and the so-called ζ-factor technique. We will demonstrate the reliability of our approach as well as its applicability by investigating Au-Ag and Au-Pt hetero nanostructures. Given its simplicity, we expect that the method could become a new standard in the field of chemical characterization using electron microscopy.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Daniele Zanaga, Thomas Altantzis, Jonathan Sanctorum, Bert Freitag, Sara Bals,