Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
8037921 | Ultramicroscopy | 2016 | 17 Pages |
Abstract
Single crystal scintillators are frequently used for electron detection in scanning electron microscopy (SEM). We report gadolinium aluminum gallium garnet (GAGG:Ce) single crystalline films as a new perspective scintillators for the SEM. For the first time, the epitaxial garnet films were used in a practical application: the GAGG:Ce scintillator was incorporated into a SEM scintillation electron detector and it showed improved image quality. In order to prove the GAGG:Ce quality accurately, the scintillation properties were examined using electron beam excitation and compared with frequently used scintillators in the SEM. The results demonstrate excellent emission efficiency of the GAGG:Ce single crystalline films together with their very fast scintillation decay useful for demanding SEM applications.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Jan Bok, OndÅej Lalinský, Martin HanuÅ¡, Zuzana OnderiÅ¡inová, Jakub Kelar, Miroslav KuÄera,