Article ID Journal Published Year Pages File Type
8038025 Ultramicroscopy 2016 5 Pages PDF
Abstract
This paper presents a 3D computational framework for evaluating electrostatic properties of a single field emitter characterized by the hemisphere-on-post geometry. Numerical simulations employed the finite elements method by using Ansys-Maxwell software. Extensive parametric simulations were focused on the threshold distance from which the emitter field enhancement factor (γ) becomes independent from the anode-substrate gap (G). This investigation allowed demonstrating that the ratio between G and the emitter height (h) is a reliable reference for a broad range of emitter dimensions; furthermore, results permitted establishing G/h≥2.2 as the threshold condition for setting the anode without affecting γ.
Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
Authors
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