Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
8038070 | Ultramicroscopy | 2015 | 6 Pages |
Abstract
We demonstrate absolute scale agreement between the number of X-ray counts in energy dispersive X-ray spectroscopy using an atomic-scale coherent electron probe and first-principles simulations. Scan-averaged spectra were collected across a range of thicknesses with precisely determined and controlled microscope parameters. Ionization cross-sections were calculated using the quantum excitation of phonons model, incorporating dynamical (multiple) electron scattering, which is seen to be important even for very thin specimens.
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Authors
Z. Chen, A.J. D'Alfonso, M. Weyland, D.J. Taplin, L.J. Allen, S.D. Findlay,