| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8038161 | Ultramicroscopy | 2015 | 8 Pages |
Abstract
In this paper I briefly review the use of electrostatic electron mirrors to correct the aberrations of the cathode lens objective lens in low energy electron microscope (LEEM) and photo electron emission microscope (PEEM) instruments. These catadioptric systems, combining electrostatic lens elements with a reflecting mirror, offer a compact solution, allowing simultaneous and independent correction of both spherical and chromatic aberrations. A comparison with catadioptric systems in light optics informs our understanding of the working principles behind aberration correction with electron mirrors, and may point the way to further improvements in the latter. With additional developments in detector technology, 1Â nm spatial resolution in LEEM appears to be within reach.
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Authors
R.M. Tromp,