Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
8038162 | Ultramicroscopy | 2015 | 12 Pages |
Abstract
Thermal magnetic field noise from magnetic and non-magnetic conductive parts close to the electron beam recently has been identified as a reason for decoherence in high-resolution transmission electron microscopy (TEM). Here, we report about new experimental results from measurements for a layered structure of magnetic and non-magnetic materials. For a simplified version of this setup and other situations we derive semi-analytical models in order to predict the strength, bandwidth and spatial correlation of the noise fields. The results of the simulations are finally compared to previous and new experimental data in a quantitative manner.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Stephan Uhlemann, Heiko Müller, Joachim Zach, Max. Haider,