| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8038211 | Ultramicroscopy | 2015 | 14 Pages |
Abstract
We describe a comprehensive model of a commercial indirect X-ray imaging detector that accurately predicts the detector point spread function and its dependence on X-ray energy. The model was validated by measurements using monochromatic synchrotron radiation and extended to polychromatic X-ray sources. Our approach can be used to predict the performance of an imaging detector and can be used to optimize imaging experiments with broad-band X-ray sources.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
C. Doshi, G. van Riessen, E. Balaur, M.D. de Jonge, A.G. Peele,