Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
8038220 | Ultramicroscopy | 2015 | 8 Pages |
Abstract
The determination of atomic scale structural and compositional information using atom probe tomography is currently limited to elemental solids and dilute alloys. In the present article, a unique coupling of orientation microscopy and atom probe tomography successfully facilitates the crystallographic study of non-dilute alloy systems, with high evaporation fields. This reproducible methodology affords a new perspective to the conventional atom probe tomography of ordered precipitate strengthened superalloys. The high accuracy in crystallographic site-specific sample preparation results in high spatial resolution in APT, which has been demonstrated in Co-base superalloys. The practical applications of this technique can be extended to accurately characterize the nature of buried order/disorder interfaces at the atomic scale, as well as the site occupancies associated with different solute atoms in multi-component superalloys.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
S. Meher, P. Nandwana, T. Rojhirunsakool, J. Tiley, R. Banerjee,